𝔖 Bobbio Scriptorium
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7631. Selective suppression of photochemical dry etching using elevated surface impurity concentrations: a new technique for self-aligned etching: C I H Ashby et al, J Appl Phys, 68, 1990, 2406–2410


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
299 KB
Volume
42
Category
Article
ISSN
0042-207X

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