✦ LIBER ✦
7407. Auger electron spectroscopy and X-ray diffraction studies of Ti-Si layers synthesised by ion implantation: S V Vidwans et al, Radiat Eff, 114, 1990, 93–97
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 150 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0042-207X
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