𝔖 Bobbio Scriptorium
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7179. A comparison of SiO2 planarization layers by hallow cathode enhanced direct current reactive magnetron sputtering and radio frequency magnetron sputtering: DF Dawson-Elli et al, J Vac Sci Technol, A8, 1990, 1294–1298


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
151 KB
Volume
42
Category
Article
ISSN
0042-207X

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