63.4: Extraction of the Location and the Energy Level of the Trap using Random Telegraph Noise in GaN-based Light-Emitting Diode

✍ Scribed by Jungjin Park; Donghoon Kang; Joong-Kon Son; Hyungcheol Shin

• Book ID: 115558192
• Publisher: Wiley (John Wiley & Sons)
• Year: 2012
• Weight: 586 KB
• Volume: 43
• Category: Article
• ISSN: 0003-966X
• DOI: 10.1002/j.2168-0159.2012.tb05923.x