✦ LIBER ✦
588. Investigation of defect formation in silicon irradiated by ions using the method of electron paramagnetic resonance: N N Gerasimenko et al, Fiz Tekh Polup, 5 (9), 1971, 1700–1705 (in Russian)
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 146 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.