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577. Apparatus for measurement of the dielectric properties of a film during deformation at a broad range of rates and temperatures: A M Arev and A V Sotnikov, Zavodsk Lab, 36 (5), 1970, 624–625 (in Russian)


Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
170 KB
Volume
21
Category
Article
ISSN
0042-207X

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