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5356. Sharp profiles with high aM low doping levels in silicon grown by molecular beam epitaxy: S S Iyer et al, J Appl Phys, 52 (9), 1981, 5608–5613


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
151 KB
Volume
32
Category
Article
ISSN
0042-207X

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