5293. Electrical resistivity and structure of thin nickel films—effect of annealing: V Starý and K Šefčik, Vacuum, 31 (8–9), 1981, 345–349

• Book ID: 103465957
• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 154 KB
• Volume: 32
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(82)93889-1