✦ LIBER ✦
5248. LEED investigation of extended defects at the surface of Ge films grown epitaxially on GaAs(110): H M Clearfield et al, J Vac Sci Technol, 19 (3), 1981, 323–330
- Publisher
- Elsevier Science
- Year
- 1982
- Tongue
- English
- Weight
- 156 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0042-207X
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