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5.2: New Technique of Measuring of the Jones Matrix for a Polarization Medium at Oblique Light Incidence

✍ Scribed by Saitoh, Yukito; Mori, Hiroyuki; Hirakata, Junichi; Mihayashi, Keiji

Book ID: 121198780
Publisher: Wiley (John Wiley & Sons)
Year: 2005
Weight: 411 KB
Volume: 36
Category: Article
ISSN: 0003-966X
DOI: 10.1889/1.2036486

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📜 SIMILAR VOLUMES

Extended Jones matrix representation for

Extended Jones matrix representation for the twisted nematic liquid-crystal display at oblique incidence

✍ Lien, A. 📂 Article 📅 1990 🏛 American Institute of Physics 🌐 English ⚖ 535 KB

Reflectance of an absorbing substrate fo

Reflectance of an absorbing substrate for incident light of arbitrary polarization: appearance of a secondary maximum at oblique incidence

✍ Azzam, R. M. A. ;El-Saba, A. M. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 369 KB

Introduction, Quality Control in Industr

Introduction, Quality Control in Industry.by W. A. Bennett;Lecture 1, Direct Measurement.by E. H. Sealy;Lecture 2, Number Defectives.by D. J. Desmond;Lecture 3, Application and Organisation of Statistical Quality Control in a Light Engineering Plant.by D. S. McNaughton;Lecture 4, Part 1. Practical Application of Statistical Quality Control in the Press Shop.by W. N. Baker;Lecture 4, Part 2. The Practical Application and Organisation of Statistical Quality Control in Deep Drawing Press Shop.by H. C. Webb;Lecture 5, Sampling Schemes for Number defectives Inspection, for Quality Estimation of Single Lots.by A. W. Swan; Lecture 6, Associated Statistical Techniques.; J. W. Rodgers

✍ Review by: Irving W. Burr and Paul Peach 📂 Article 📅 1946 🏛 American Statistical Association 🌐 English ⚖ 651 KB