𝔖 Bobbio Scriptorium

✦ LIBER ✦

515. Device for measuring the thickness of thin films: Yu. A. Durasova and E. N. Rybak, Instrum. & Exper. Tech., (1), Oct. 1963, 183–184; translated from the Russian in Pribory i Tekhn. Eksper., (1), Jan.–Feb. 1963, 195–196

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 74 KB
Volume: 14
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(64)90943-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

517. Activation method of measuring thic

517. Activation method of measuring thickness of thin films and foils: F. P. Denisov., Instrum. & Exper. Techn. (1), Oct. 1963, 146–148; translated from the Russian in Pribory i Tekhn. Eksper. (1), Jan.–Feb. 1963, 155–157

📂 Article 📅 1964 🏛 Elsevier Science 🌐 English ⚖ 74 KB

516. Measurements of the thickness of co

516. Measurements of the thickness of coatings by the registration of scattered beta-radiation: Yu. S. Zaslavskii et al., Instrum. & Exper. Techn.,(1), Oct. 1963, 141–143; translated from the Russian in Pribory i Tekhn. Eksper., (1), Jan.–Feb. 1963, 149–152

📂 Article 📅 1964 🏛 Elsevier Science 🌐 English ⚖ 74 KB