513. Electron microscopic investigations of evaporated nickel films. (II) Surface roughness and orientation of the films: R. Suhrmann et al., Z. Naturforsch., 18a (11), Nov. 1963, 1431–1214

• Publisher: Elsevier Science
• Year: 1964
• Tongue: English
• Weight: 74 KB
• Volume: 14
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(64)90941-8