488. On the mechanism of formation of the saturation region of emission current in the field emission microscopy of semiconductors: N V Egorov et al, Fiz Tverd Tela, 13 (6), 1971, 1823–1824 (in Russian)

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 305 KB
• Volume: 22
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(72)90339-9