✦ LIBER ✦

4763066 Automatic test equipment for integrated circuits

✍ Scribed by PaulK.K. Yeung; AlanD. Howard; James Hoo; JamesL. Pennock

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4752729 Test circuit for VSLI integrated

✍ Keit Jackson; JeffreyA Niehaus 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 90 KB

4727317 Device orientation test method s

✍ MartinJ Oliver 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 93 KB

4961053 Circuit arrangement for testing

✍ Heinz Krug 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 84 KB

Automatic test pattern generation for in

✍ M.H. Konijnenburg; J.Th. van der Linden; A.J. van de Goor 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 759 KB

4567432 Apparatus for testing integrated

✍ DouglasA Buol; DeanN Mize; John Pattschull; Robert Wallace 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 105 KB

4677375 Apparatus for testing integrated

✍ Toshiyuki Nakaie; Akira Yoshino 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 180 KB