✦ LIBER ✦

4750890 Test socket for an integrated circuit package

✍ Scribed by Milford Dube; PeterE Kuhn; HarryP Yorgensen

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 92 KB
Volume: 29
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(89)90596-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

4533192 Integrated circuit test socket

✍ LewisJ Kelley 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 81 KB

4718855 Socket for integrated circuit co

4718855 Socket for integrated circuit component

✍ TimothyB Billman; JamesR Coller; Gary Marpoe 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 80 KB

4686468 Contact set for test apparatus f

4686468 Contact set for test apparatus for testing integrated circuit package

✍ Kenneth Lee; ErnestL Kallander 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 88 KB

4950980 Test socket for electronic devic

4950980 Test socket for electronic device packages

✍ WayneK Pfaff 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 89 KB

4812742 Integrated circuit package havin

4812742 Integrated circuit package having a removable test region for testing for shorts and opens

✍ KennethN Abel; JohnE Rudy 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 88 KB

Frequency-band selection for an integrat

Frequency-band selection for an integrated-circuit package antenna using LTCC technology

✍ J. J. Wang; Y. Xue; Y. P. Zhang; K. M. Chua; A. C. W. Lu; Lai L. Wai; C. K. Wong 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 129 KB

This paper describes an integrated-circuit package antenna (ICPA) designed and fabricated using low-temperature cofired ceramic (LTCC) technology for wireless transceivers. The ICPA features a shorting via for frequency-band selection. The measured results show that the prototype ICPA with a size of