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4654827 High speed testing of semiconductor memory devices

โœ Scribed by Jimmie Childers


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
91 KB
Volume
27
Category
Article
ISSN
0026-2714

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Ultra-high speed semiconductor devices a
โœ Takashi Mizutani; K. Hirata; M. Hirayama; A. Ishida ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 538 KB

This paper reviews recent progress in GaAs MESFETs and HBTs for high speed integrated circuits. SAINT MESFETs have succeeded in scaling down gate lengths to O. 1 -O. 15/zm and have realized propagation delay times of 5.9 ps gate -~. A multiplexer and demultiplexer operating at a high bit rate of 11.