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4599241 Method for inspecting defects of thin material film

โœ Scribed by Hiroshi Nakaboh; Ken Ogura

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
79 KB
Volume
27
Category
Article
ISSN
0026-2714

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๐Ÿ“œ SIMILAR VOLUMES

The material point method for simulation
The material point method for simulation of thin membranes
โœ Allen R. York II; Deborah Sulsky; Howard L. Schreyer ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 581 KB

The material-point method (MPM) is extended to handle membranes, which are discretized by a collection of unconnected material points placed along each membrane surface. These points provide a Lagrangian description of the membrane. To solve for the membrane motion, data carried by the material poin