Here we propose a new approach to the testing of digital devices, which can potentially save diagnostic hardware. An example is given for testing combinational devices. Estimates are given for reliability and hardware complexity, and an algorithm for designing operability tests is described.
โฆ LIBER โฆ
4566104 Testing digital electronic circuits
โ Scribed by GeorgeM Bradshaw; PeterL.L. Desyllas; Keit McLaren
- Book ID
- 103281339
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 92 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.
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