✦ LIBER ✦
4553435 Elevated transient temperature leak test for unstable microelectronic packages
✍ Scribed by Harold Goldfarb; KennethL Perkins; BernardL Weigand
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 92 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
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