4539517 Method for testing an integrated circuit chip without concern as to which of the chip's terminals are inputs or outputs

✍ Scribed by LaurenceP Flora

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 80 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90689-x