✦ LIBER ✦
4532423 IC tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested
✍ Scribed by Toru Tojo; Kazuyoshi Sugihara
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 160 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
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