4504784 Method of electrically testing a packaging structure having n interconnected integrated circuit chips

✍ Scribed by Prabhakar Goel; MauriceT McMahon

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 78 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90426-3