✦ LIBER ✦
4210. Method for the cross-sectional examination of molecular semi-conductor/metal film junctions using transition electron microscopy. (USA)
- Book ID
- 104265115
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 233 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.
✦ Synopsis
effects and it is shown that angle-resolved measurements can give information on the symmetry of surface states.