✦ LIBER ✦
4146. Comparative study of annealed neon-, argon- and krypton-ion implantation damage in silicon. (USA)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 140 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0042-207X
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