✦ LIBER ✦

40Gbit/s error-free operation of oxide-confined 850nm VCSEL

✍ Scribed by Westbergh, P. (author);Gustavsson, J. S. (author);Kögel, B. (author);Haglund, A. (author);Larsson, A. (author);Mutig, A. (author);Nadtochiy, A. (author);Bimberg, D. (author);Joel, A. (author)

Book ID: 111687625
Publisher: The Institution of Electrical Engineers
Year: 2010
Tongue: English
Weight: 216 KB
Volume: 46
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el.2010.1405

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

40 Gbit/s error-free operation of oxide-

40 Gbit/s error-free operation of oxide-confined 850 nm VCSEL

✍ Westbergh, P.; Gustavsson, J.S.; Kögel, B.; Haglund, Å.; Larsson, A.; Mutig, A 📂 Article 📅 2010 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 216 KB

Oxide-confined 850 nm VCSELs operating a

Oxide-confined 850 nm VCSELs operating at bit rates up to 40 Gbit/s

✍ Blokhin, S.A.; Lott, J.A.; Mutig, A.; Fiol, G.; Ledentsov, N.N.; Maximov, M.V.; 📂 Article 📅 2009 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 244 KB

20 Gbit/s error-free operation of 850 nm

20 Gbit/s error-free operation of 850 nm oxide-confined VCSELs beyond 1 km of multimode fibre

✍ Safaisini, R.; Szczerba, K.; Haglund, E.; Westbergh, P.; Gustavsson, J.S.; Larss 📂 Article 📅 2012 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 403 KB

60 Gbits error-free 4-PAM operation with

60 Gbits error-free 4-PAM operation with 850 nm VCSEL

✍ Westbergh, P.; Karlsson, M.; Larsson, A.; Andrekson, P.A.; Szczerba, K. 📂 Article 📅 2013 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 269 KB

High-speed 850 nm VCSELs operating error

High-speed 850 nm VCSELs operating error free up to 57 Gbit/s

✍ Safaisini, R.; Haglund, E.; Larsson, A.; Gustavsson, J.S.; Haglund, E.P.; Westbe 📂 Article 📅 2013 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 222 KB

56 fJ dissipated energy per bit of oxide

56 fJ dissipated energy per bit of oxide-confined 850 nm VCSELs operating at 25 Gbit/s

✍ Moser, P.; Lott, J.A.; Wolf, P.; Larisch, G.; Li, H.; Ledentsov, N.N.; Bimberg, 📂 Article 📅 2012 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 357 KB