This paper presents a comparison of the embedded ion method (EIM) and the surface charge representation of the electrostatic embedding potential (SCREEP) method, two methods which can be used to calculate solid-state effects on NMR chemical shifts. The results in a selected group of compounds with k
31P Solid state NMR geometrical effects on the chemical shift tensor
β Scribed by J.P. Dutasta; J.B. Robert; L. Wiesenfeld
- Publisher
- Elsevier Science
- Year
- 1981
- Tongue
- English
- Weight
- 261 KB
- Volume
- 77
- Category
- Article
- ISSN
- 0009-2614
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