The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. This workshop provides a informal forum to discuss all aspects of on-line testing. To be held annually at different sites, the Workshop is sponsored by the IEEE Computer Society Test Technology Technical Committee, co-organized by TTTC On-line Testing Technical Activity Committee and the European Group of the Test Technology Technical Committee (ETTTC). The topics include (but are not limited to) the following ones:
Concurrent checking * Periodic testing in the field * Field Diagnosis * Self-Checking digital, analog and mixed-signal circuits * Coding theory * On-line and Off-line BIST * Synthesis of on-line testable circuits * Radiation hardened/tolerant processes and design techniques * Sensors/detectors for on-line monitoring of current, temperature and other reliability relevant parameters * Fault-tolerant and fail-safe systems * On-line testing in automotive, railway, avionics, industrial control and space applications
To encourage and facilitate informal discussion mandates that participation be limited. Those interested in presenting recent results at the workshop submit three copies of an extended abstract, one to three pages long, to the Program Chair. Please observe the following deadlines: