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274: Cumulative Incidence and Pattern of Adverse Events in the First 60 Days Post Ventricular Assist Device Implantation

✍ Scribed by E.A. Genovese; M.A. Dew; M.A. Simon; J.J. Teuteberg; J. Kay; M.P. Siegenthaler; J.K. Bhama; C. Bermudez; K.L. Lockard; S. Winowich; R.L. Kormos

Book ID: 116520581
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 110 KB
Volume: 27
Category: Article
ISSN: 1557-3117
DOI: 10.1016/j.healun.2007.11.283

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