Growth kinetics of stoichiometric SiC la
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L. Wang; Y.E. Zhao; Dihu Chen; S.P. Wong
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Article
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2005
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Elsevier Science
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English
⚖ 339 KB
SiC layers were formed by implantation of C + into silicon at 35 keV to fluence of 1 • 10 18 cm À2 . Thermal annealing was performed at 900 °C for various time intervals from 1 h to 8 h, and at various temperatures from 700 °C to 1200 °C for 2 h in nitrogen ambient. The phase transformation characte