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256. Physical processes at breakdown of silicon monoxide films: G A Vorobev and V A Mukhachev, Izv VUZ Fiz, 11, 1972, 36–41 (in Russian)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 141 KB
Volume: 24
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(74)92597-4

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The thermal dependence of electric stren

The thermal dependence of electric strength of silicon monoxide thin films: V A Mukhachev and N S Mukhacheva, Izv VUZ Fiz, No 11, 1970, 155–157 (in Russian).

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 145 KB