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2234. Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurements: H W Werner and A E Morgan,J Appl Phys, 47 (4), 1976, 1232–1242


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
159 KB
Volume
26
Category
Article
ISSN
0042-207X

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