217. Application of x-ray microanalysis for electronic material testing with electron probe: T Zero, Elektronika, 11 (1), 1970, 36–41 (in Polish)

• Book ID: 103454810
• Publisher: Elsevier Science
• Year: 1971
• Tongue: English
• Weight: 167 KB
• Volume: 21
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(71)91118-3