✦ LIBER ✦
214. Mechanisms of d.c. electrical breakdown in thin silicon oxide films: Kleinet al,Phys of Failure in Electron, 3,1965, 315–332
- Publisher
- Elsevier Science
- Year
- 1966
- Tongue
- English
- Weight
- 112 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0042-207X
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