✦ LIBER ✦
2110. Depth distribution and annealing of defects in silicon implanted with lithium ions: N A Skakun et al,Fiz Tverd Tela, 17 (3), 1975, 927–929 (in Russian)
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 130 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0042-207X
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