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200 nm gate-length GaAs-based MHEMT devices by electron beam lithography

✍ Scribed by Xu, JingBo ;Zhang, HaiYing ;Wang, WenXin ;Liu, Liang ;Li, Ming ;Fu, XiaoJun ;Niu, JieBin ;Ye, TianChun


Book ID
107368626
Publisher
Elsevier
Year
2008
Tongue
English
Weight
685 KB
Volume
53
Category
Article
ISSN
2095-9273

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