✦ LIBER ✦
2 MeV e-irradiation UHVEM study on the impact of O and Ge doping on {113}-defect formation in Si
✍ Scribed by Vanhellemont, J. ;Yasuda, H. ;Tokumoto, Y. ;Ohno, Y. ;Suezawa, M. ;Yonenaga, I.
- Book ID
- 112181009
- Publisher
- John Wiley and Sons
- Year
- 2012
- Tongue
- English
- Weight
- 654 KB
- Volume
- 209
- Category
- Article
- ISSN
- 0031-8965
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