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2-D MOSFET modeling including surface effects and impact ionization by self-consistent solution of the Boltzmann, Poisson, and hole-continuity equations

✍ Scribed by Wenchao Liang; Goldsman, N.; Mayergoyz, I.; Oldiges, P.J.

Book ID: 114536735
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 515 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.557713

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