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1/f noise performance of MOSFETs with HfO2 and metal gate on Ge-on-insulator substrates

✍ Scribed by P. Srinivasan; E. Simoen; B. De Jaeger; C. Claeys; D. Misra


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
267 KB
Volume
9
Category
Article
ISSN
1369-8001

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