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1/f noise in Si0.8Ge0.2 pMOSFETs under Fowler-Nordheim stress

✍ Scribed by Young-Joo Song; Jung-Wook Lim; Bongki Mheen; Sang-Hoon Kim; Hyun-Chul Bae; Jin-Young Kang; Jeong-Hoon Kim; Jong-In Song; Kyung-Wan Park; Kyu-Hwan Shim

Book ID: 114617057
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 413 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.812477

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