Flux motion dissipation in La2βxSrxCuO4
β
Minoru Suzuki
π
Article
π
1991
π
Elsevier Science
π
English
β 216 KB
Resistive transition of La~\_=Sr=CuO~ single-crystM thin films with various x has been measured under magnetic fields. It is found that resistivity p scales as p(T) = p0 exp{-U(H)[1 -TITtle/ks} with n = 3 for Hl[c and n = 1.5 ,~ 2.5 for ~ I c dependi~tg on x. The resistive behavior is explained by t