Large-signal modelling and measuring go
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Dominique Schreurs; Jan Verspecht
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Article
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2000
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John Wiley and Sons
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English
โ 273 KB
Classical large-signal device models are indirectly derived from small-signal S-parameter measurements. Due to the availability of the nonlinear network measurement ( ) system NNMS , models can be based directly upon full two-port large-signal measurements, resulting in higher model accuracy. In thi