✦ LIBER ✦
1616. Influence of traps and leakage currents on the characteristics of thin film field effect transistors: A G Zhdan et al, Radiotekh Elektron, 13 (6), June 1968, 1055–1063 (in Russian).
- Publisher
- Elsevier Science
- Year
- 1968
- Tongue
- English
- Weight
- 301 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.