1608. BiSb two-layer thin film systems as the objects for testing electron microscopes: V M Kosevich et al, Pribory Tekh Eksper, 13 (3), May–June 1968, 192–195 (in Russian).

• Book ID: 103454298
• Publisher: Elsevier Science
• Year: 1968
• Tongue: English
• Weight: 150 KB
• Volume: 18
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(68)92391-9