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16-term error model and calibration procedure for on-wafer network analysis measurements

✍ Scribed by Butler, J.V.; Rytting, D.K.; Iskander, M.F.; Pollard, R.D.; Vanden Bossche, M.

Book ID: 114550919
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 609 KB
Volume: 39
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.106567

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