𝔖 Bobbio Scriptorium
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1550. Investigation of the mechanism of electrical breakdown in high voltage pulsed modulator devices and ways of increasing the electrical strength of these devices: P V Poshekhonov et al, Elektron Tekh Gener Modul Rentgen Prib, 3, 1969, 33–42 (in Russian)


Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
135 KB
Volume
21
Category
Article
ISSN
0042-207X

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