𝔖 Bobbio Scriptorium
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150. Gas permeation study and imperfection detection of thermally grown and deposited thin silicon dioxide films: S. W. Ing, Jr., et al., J. Electrochem. Soc., 109, March 1962, 221–226


Book ID
103444954
Publisher
Elsevier Science
Year
1963
Tongue
English
Weight
139 KB
Volume
13
Category
Article
ISSN
0042-207X

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