✦ LIBER ✦
1220. Analysis of thin surface layers and impurity profiles by back-scattering and channeling of MeV helium ions: J Gyulai et al, International Conf Phys Chem Semiconductors HeterojunctionsLayer Structure, Vol 5, No 5, Akademia Kiado Budapest 1971 293–301
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 137 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0042-207X
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