Expert system for the voltammetric deter
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M. Esteban; I. RuisΓ‘nchez; M.S. Larrechi; F.X. Rius
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Article
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1992
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Elsevier Science
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English
β 783 KB
An expert system for the voltammetnc deternunatlon of Cu, Zn, Cd, Pb and In was developed The system guides the user m the choice of sample treatment, the most appropriate voltammetric procedure and the ldentlficatlon and determination of the trace metals The techniques implemented are differential-