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1181. Influence of volume traps on the capacitance at the CdSe-SiOx interface: E H Weber and K Nienerowski, International Conf Phys Chem Semiconductors Heterojunctions Layer Structure, Vol 4, Akademiai Kiado Budapest 1971, 213–220


Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
144 KB
Volume
22
Category
Article
ISSN
0042-207X

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