1178. Current and breakdown characteristics of amorphous SIO2 in metal-oxide-semiconductor structure: A Plenier and B K Chakraverty, International Conf Phys Chem Semiconductors Heterojunctions Layer Structure, Vol 4, Akademiai Kiado Budapest 1971, 161–170

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 149 KB
• Volume: 22
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(72)91373-5